Visual inspection system for crimp inspection

dc.contributor.author	Dias, D.L.K.C.
dc.contributor.author	Jayasinghe, J.M.J.W.
dc.date.accessioned	2020-07-22T05:48:14Z
dc.date.available	2020-07-22T05:48:14Z
dc.date.issued	2016
dc.identifier.citation	Proceedings of Annual Symposium on Research and Industrial Training of Department of Electronics, 24th March, 2016:p.333-338
dc.identifier.uri	http://repository.wyb.ac.lk/handle/1/1522
dc.publisher	Faculty of Applied Sciences, Wayamba University of Sri Lanka, Kuliyapitiya
dc.subject	Proceedings
dc.subject	Crimp inspection
dc.subject	Digital microscope
dc.subject	OpenCV
dc.title	Visual inspection system for crimp inspection
dc.type	Conference Paper

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