dc.contributor.author |
Thilakarathna HAN |
|
dc.contributor.author |
Napagoda NADN |
|
dc.date.accessioned |
2022-01-21T07:30:44Z |
|
dc.date.available |
2022-01-21T07:30:44Z |
|
dc.date.issued |
2019 |
|
dc.identifier.citation |
Proceedings of the 11th Symposium on Applied Science, Business & Industrial Research – 2019 |
en_US |
dc.identifier.issn |
2279-1558 |
|
dc.identifier.uri |
http://repository.wyb.ac.lk/handle/1/3539 |
|
dc.description.abstract |
The electric and electronic industry is one of the key manufacturing industries in Sri Lanka
which contributes the export revenues. Defects are considered as wastes and reduction of wastage is
more important for any industry. The main purpose of this study is minimizing defects in ABC
Company. Our research attempts to reduce the cost of reworking and save to time while increasing
the quality of the product. Data of total checked pieces and defect pieces in combined data set were
considered to identify most occurred defect type in process capability analysis and binomial process
capability analysis. DMAIC (Define-Measure-Analyze-Improve-Control) was the main method
used in the study to know the major defect type and some critical causes for the identified defect
type. C0 defect was the main defect type of the company. Two-way ANOVA (Analysis of Variance)
was performed to check the significance difference between mean numbers of defects in machines.
In order to minimize the critical causes for defects, our study suggested conducting a proper
training and maintaining the cleanliness. |
en_US |
dc.language.iso |
en |
en_US |
dc.subject |
ANOVA |
en_US |
dc.subject |
Critical causes, |
en_US |
dc.subject |
Defects |
en_US |
dc.subject |
DMAIC |
en_US |
dc.subject |
Process capability analysis |
en_US |
dc.title |
Application Of DMAIC Method to Minimize Defects in A Capacitor Manufacturing Process |
en_US |
dc.type |
Article |
en_US |